Researchers at Colorado State University have developed an approach to combine functional data with structural data for a wide range of materials. The approach overlays structural (e.g., electron, scanning probe, or optical microscopy images) and functional images (e.g., PL, Raman, Photocurrent images), which is particularly useful for ultrathin nanosystems (such as 2D transition metal dichalcogenides (MoS2) and perovskite photovoltaics). The method incorporates novel software as well as hardware modifications to quantitatively and seamlessly screen material performance in a single step.
Monolayer (Transition metal dichalcogenide) TMDs represent the ultimate miniaturization limit for efficient ultrathin and ultralight photovoltaics with continued interest in application toward space power systems, internet-of-things devices, as well as portable and flexible electronics. For large area application, defected and heterogeneity in these systems play an essential role in determination of overall device performance. And while many industries and research domains measure functional signals (Ex: light emission, photo-induced current) using focused laser beams, no such technique exists to overlay those images with topographical data seamlessly and quantitatively.
Novel algorithms along with hardware modifications to the microscopic / spectroscopic apparatus allows for the collection and processing of reflected laser signal.
Figure 1 Structural overlay procedure using TMD features below depicts:
